Radiation Hardening: Approach and Reliability Impacts

BRUNO, MONSUEZ and HYCHAM, ABOUTALEB (2014) Radiation Hardening: Approach and Reliability Impacts. In: Second International Conference on Advances in Computing, Electronics and Electrical Technology - CEET 2014, 20 - 21 December, 2014, Kuala Lumpur, Malaysia.

20141226_084303.pdf - Published Version

Download (676kB) | Preview
Official URL: https://www.seekdl.org/conferences/paper/details/4...


In aerospace field, it is necessary to address the radiation effects to which they are especially sensitive. Besides, the reuse of existing components implies that a modification of the architecture is sometimes expected to meet the safety requirements for such critical applications. To achieve such safety level, physical radiation hardening is usually used despite its cost. However, by performing a radiation hardening, it is possible to achieve the expected results while decreasing the expected cost of such an evolution. As a first step, a state of the art of existing mechanisms for logical radiation hardening is performed. These mechanisms are evaluated according a set of parameters: the type of errors they address, whether it is for purpose of detection or correction, the performance, the necessary additional physical volume, the computing time. To select the mechanisms to be used, a trade-off is performed, which depends also on the reliability analysis performed as well as the components that are concerned and on which the mechanisms are to be applied. A comparison between the unprotected module and the protected module is performed. The results obtained show that the optimized selection of hardening mechanisms yields to an improvement in reliability.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: reliability, hardening techniques, trade-off, safety
Depositing User: Mr. John Steve
Date Deposited: 26 Apr 2019 04:36
Last Modified: 26 Apr 2019 04:36
URI: http://publications.theired.org/id/eprint/1474

Actions (login required)

View Item View Item