A 300 Mrad total-ionizing dose experiment for lasers used for holographic memories

MINORU, WATANABE and TOMOYA, AKABE (2016) A 300 Mrad total-ionizing dose experiment for lasers used for holographic memories. In: Sixth International Conference On Advances in Computing, Electronics and Electrical Technology - CEET 2016, 26-27 November 2016, Kuala Lumpur, Malaysia.

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Abstract

Recently, optically reconfigurable gate arrays (ORGAs) have been under development to produce radiation-hardened field programmable gate arrays (FPGAs). An ORGA consists of a laser array, a holographic memory, and a programmable gate array VLSI. Since holographic memories are very robust against radiation compared with semiconductor devices, the ORGA exploits the radiation tolerance of holographic memories to increase the radiation tolerance of the entire ORGA device. This paper presents experimentally obtained results of a part of an ORGA device. We have conducted an experiment using a cobalt 60 gamma radiation source to confirm the total ionizing dose (TID) tolerance of an ORGA. Results show that a laser used in the ORGA can function correctly even after receiving a 300 Mrad TID.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Radiation hardened field programmable gate arrays, Optically reconfigurable gate arrays
Depositing User: Mr. John Steve
Date Deposited: 20 Mar 2019 11:31
Last Modified: 20 Mar 2019 11:31
URI: http://publications.theired.org/id/eprint/680

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